International Research Journal of Commerce , Arts and Science

 ( Online- ISSN 2319 - 9202 )     New DOI : 10.32804/CASIRJ

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APPLICATION OF X-RAY DIFFRACTION TECHNIQUE FOR DETERMINATION OF LATTICE CONSTANT OF METAL COMPLEX

    1 Author(s):  ANURAG GEETE

Vol -  15, Issue- 6 ,         Page(s) : 247 - 253  (2024 ) DOI : https://doi.org/10.32804/CASIRJ

Abstract

X-rays are electromagnetic radiations, which lie between ultraviolet and gamma rays in the electromagnetic spectrum [1]. X-rays are characterized by the relatively short wavelengths of 0.01 Å to 100 Å

[1] Selman, J. and Thomas, C.C., 1985. The fundamentals of x-ray and radium physics.
[2] Chang, Z., Rundquist, A., Wang, H., Murnane, M.M. and Kapteyn, H.C., 1997. Generation of coherent soft X rays at 2.7 nm using high harmonics. Physical Review Letters, 79(16), p.2967.

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